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Testability Concepts for Digital ICs

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Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.

Undertitel
The Macro Test Approach
Upplaga
1995
ISBN
9781461360049
Språk
engelska
Vikt
281 gram
Utgivningsdatum
2012-10-04
Sidor
212