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Test Generation of Crosstalk Delay Faults in VLSI Circuits
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Test Generation of Crosstalk Delay Faults in VLSI Circuits

inbunden, 2018
Engelska
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The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
Upplaga
2019 ed.
ISBN
9789811324925
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2018-10-10
Sidor
156