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Secondary Ion Mass Spectrometry SIMS III
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Secondary Ion Mass Spectrometry SIMS III

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Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Undertitel
Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
Upplaga
Softcover reprint of the original 1st ed. 1982
ISBN
9783642881541
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2012-07-26
Sidor
447