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Scanning Microscopy for Nanotechnology
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Scanning Microscopy for Nanotechnology

Engelska
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Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.

Undertitel
Techniques and Applications
Upplaga
Softcover reprint of hardcover 1st ed. 2007
ISBN
9781441922090
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2010-10-29
Sidor
522