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Quantitative X-Ray Diffractometry
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Quantitative X-Ray Diffractometry

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One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases.
Redaktör
Inez Mureinik
Upplaga
Softcover reprint of the original 1st ed. 1995
ISBN
9781461395379
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2011-12-27
Sidor
372