Gå direkt till innehållet
Physical Principles of Electron Microscopy
Spara

Physical Principles of Electron Microscopy

Författare:
inbunden, 2005
Engelska
Lägsta pris på PriceRunner

Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

Undertitel
An Introduction to TEM, SEM, and AEM
Författare
R.F. Egerton
Upplaga
1st ed. 2005. Corr. 2nd printing 2011
ISBN
9780387258003
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2005-08-03
Sidor
202