
Machine Learning Support for Fault Diagnosis of System-on-Chip
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems.
- Redaktör
- Patrick Girard, Shawn Blanton, Li-C. Wang
- Upplaga
- 2023 ed.
- ISBN
- 9783031196416
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2024-03-14
- Sidor
- 316
