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Kelvin Probe Force Microscopy
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Kelvin Probe Force Microscopy

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Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

Undertitel
Measuring and Compensating Electrostatic Forces
ISBN
9783642271137
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2013-11-30
Sidor
334