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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Författare:
Engelska
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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Författare
Patrick Echlin
Upplaga
Softcover reprint of hardcover 1st ed. 2009
ISBN
9781441946744
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2010-11-23
Sidor
332