
Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- Författare
- Jens Lienig, Susann Rothe, Matthias Thiele
- Upplaga
- Second Edition 2025
- ISBN
- 9783031800221
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2025-02-26
- Sidor
- 167
