
Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- Författare
- Jens Lienig, Matthias Thiele
- Upplaga
- Softcover Reprint of the Original 1st 2018 ed.
- ISBN
- 9783030088118
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2018-12-14
- Sidor
- 159
