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From scientific instrument to industrial machine

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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.
Undertitel
Coping with architectural stress in embedded systems
Upplaga
2012 ed.
ISBN
9789400741461
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2012-04-29
Förlag
Springer
Sidor
112