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Evaluation of Advanced Semiconductor Materials by Electron Microscopy
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Evaluation of Advanced Semiconductor Materials by Electron Microscopy

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With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work­ shop to review the electron microscopy of advanced semiconductors.
Redaktör
David Cherns
Upplaga
Softcover reprint of the original 1st ed. 1989
ISBN
9781461278504
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2011-10-13
Sidor
412