Gå direkt till innehållet
Electromigration Inside Logic Cells
Spara

Electromigration Inside Logic Cells

Lägsta pris på PriceRunner

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

Undertitel
Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Upplaga
Softcover reprint of the original 1st ed. 2017
ISBN
9783319840413
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2018-07-05
Sidor
118