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Delay Fault Testing for VLSI Circuits
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Delay Fault Testing for VLSI Circuits

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In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech­ niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Författare
Angela Krstic
Upplaga
Softcover reprint of the original 1st ed. 1998
ISBN
9781461375616
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2012-10-12
Sidor
191