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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc.
Upplaga
2nd ed. 2007
ISBN
9780387465463
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2007-06-21
Sidor
328