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Characterization Methods for Submicron MOSFETs

1 875 kr
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The need for more deep and extensive characterization of MOSFET param­ eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi­ tive to the properties of its Si - Si0 interface.

ISBN
9781461285847
Språk
engelska
Vikt
281 gram
Utgivningsdatum
2011-09-26
Sidor
232