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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
Upplaga
2012
ISBN
9781441995476
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2011-09-22
Sidor
89