
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
- Undertitel
- A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
- Författare
- Xiaowei Li, Guihai Yan, Cheng Liu
- Upplaga
- 2023 ed.
- ISBN
- 9789811985539
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2024-03-03
- Sidor
- 304
