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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

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Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Undertitel
A User-Oriented Guide
Upplaga
2013 ed.
ISBN
9783642431739
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-11-09
Sidor
528