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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Författare:
inbunden, 2011
Engelska
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This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Författare
Weronika Walkosz
ISBN
9781441978165
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2011-04-19
Sidor
110