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Applied Scanning Probe Methods III
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Applied Scanning Probe Methods III

inbunden, 2006
Engelska
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There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
Undertitel
Characterization
Upplaga
2006 ed.
ISBN
9783540269090
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2006-02-22
Sidor
378