Spara
Testability Concepts for Digital ICs
Författare:
häftad, 2012
Engelska
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.
- Undertitel
- The Macro Test Approach
- Författare
- F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
- Upplaga
- Softcover reprint of the original 1st ed. 1995
- ISBN
- 9781461360049
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2012-10-04
- Sidor
- 212
