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Test Generation of Crosstalk Delay Faults in VLSI Circuits
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Test Generation of Crosstalk Delay Faults in VLSI Circuits

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The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
Upplaga
Softcover Reprint of the Original 1st 2019 ed.
ISBN
9789811347849
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2018-12-21
Sidor
156