Semiconductor Memories
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
- Undertitel
- Technology, Testing, and Reliability
- Författare
- Ashok K. Sharma
- ISBN
- 9780780310001
- Språk
- Engelska
- Vikt
- 1043 gram
- Utgivningsdatum
- 2002-09-24
- Förlag
- IEEE Publications,U.S.
- Sidor
- 480
