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Positron Annihilation in Semiconductors
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Positron Annihilation in Semiconductors

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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.
Undertitel
Defect Studies
Upplaga
Softcover reprint of hardcover 1st ed. 1999
ISBN
9783642084034
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2010-12-01
Sidor
383