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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.
- Undertitel
- A Scanning Probe Microscopy Approach
- Författare
- Nicholas D. Kay
- Upplaga
- Softcover reprint of the original 1st ed. 2018
- ISBN
- 9783319888989
- Språk
- Engelska
- Vikt
- 310 gram
- Serie
- Springer Theses
- Utgivningsdatum
- 2018-09-04
- Sidor
- 122
