
Helium Ion Microscopy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century.
- Undertitel
- Principles and Applications
- Författare
- David C. Joy
- Upplaga
- 2013 ed.
- ISBN
- 9781461486596
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2013-09-14
- Sidor
- 64
