Spara
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Författare:
häftad, 2010
Engelska
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Undertitel
- Process-Aware SRAM Design and Test
- Författare
- Andrei Pavlov, Manoj Sachdev
- Upplaga
- Softcover reprint of hardcover 1st ed. 2008
- ISBN
- 9789048178551
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2010-10-28
- Förlag
- Springer
- Sidor
- 194
