Spara
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Författare:
inbunden, 2008
Engelska
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Undertitel
- Process-Aware SRAM Design and Test
- Författare
- Andrei Pavlov, Manoj Sachdev
- Upplaga
- 2008 ed.
- ISBN
- 9781402083624
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2008-06-21
- Sidor
- 194
