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Characterization of Crystal Growth Defects by X-Ray Methods
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Characterization of Crystal Growth Defects by X-Ray Methods

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.
Författare
B.K. Tanner
Upplaga
Softcover reprint of the original 1st ed. 1980
ISBN
9781475711288
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2012-12-16
Sidor
589