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High Quality Test Pattern Generation and Boolean Satisfiability
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High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Upplaga
2012 ed.
ISBN
9781489988478
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-10-20
Sidor
193