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Design for Testability, Debug and Reliability

96,20 €

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Undertitel
Next Generation Measures Using Formal Techniques
ISBN
9783030692117
Språk
engelska
Vikt
281 gram
Utgivningsdatum
20.4.2022
Sidor
164