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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Författare
Weronika Walkosz
Upplaga
2011 ed.
ISBN
9781461428572
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
28.5.2013
Sidor
110