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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Författare:
inbunden, 2011
Engelska
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Författare
Weronika Walkosz
ISBN
9781441978165
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
19.4.2011
Sidor
110