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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.

Upplaga
2020 ed.
ISBN
9783030415358
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2020-03-21
Sidor
237