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Yield and Variability Optimization of Integrated Circuits
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Yield and Variability Optimization of Integrated Circuits

Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
Upplaga
Softcover reprint of the original 1st ed. 1995
ISBN
9781461359357
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2012-11-02
Sidor
234