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X-Ray Diffraction by Disordered Lamellar Structures
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X-Ray Diffraction by Disordered Lamellar Structures

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Undertitel
Theory and Applications to Microdivided Silicates and Carbons
Översättare
R. Setton
Upplaga
Softcover reprint of the original 1st ed. 1990
ISBN
9783642748042
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2011-12-13
Sidor
371