
Scanning Microscopy for Nanotechnology
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.
- Undertitel
- Techniques and Applications
- Redaktör
- Weilie Zhou, Zhong Lin Wang
- Upplaga
- 2007 ed.
- ISBN
- 9780387333250
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2006-11-27
- Sidor
- 522