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Scanning Microscopy for Nanotechnology
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Scanning Microscopy for Nanotechnology

inbunden, 2006
Engelska

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.

Undertitel
Techniques and Applications
Upplaga
2007 ed.
ISBN
9780387333250
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2006-11-27
Sidor
522