Spara
Scanning Electron Microscopy and X-Ray Microanalysis
häftad, 2013
Engelska
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
- Undertitel
- Third Edition
- Författare
- Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
- Upplaga
- Third Edition 2003
- ISBN
- 9781461349693
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2013-05-31
- Sidor
- 689
