Spara
Principles of Analytical Electron Microscopy
häftad, 2013
Engelska
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
- Redaktör
- Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
- Upplaga
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781489920393
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2013-07-08
- Sidor
- 448
