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Nanometer Variation-Tolerant SRAM
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Nanometer Variation-Tolerant SRAM

This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
Undertitel
Circuits and Statistical Design for Yield
Upplaga
2013 ed.
ISBN
9781493902200
Språk
Engelska
Vikt
310 gram
Utgivningsdatum
2014-10-15
Sidor
172