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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
Upplaga
2021 ed.
ISBN
9783030683672
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2021-03-11
Sidor
131