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Metal Impurities in Silicon- and Germanium-Based Technologies
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Metal Impurities in Silicon- and Germanium-Based Technologies

material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
Undertitel
Origin, Characterization, Control, and Device Impact
Upplaga
1st ed. 2018
ISBN
9783319939247
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2018-08-22
Sidor
438