
Kelvin Probe Force Microscopy
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.
- Undertitel
- Measuring and Compensating Electrostatic Forces
- Redaktör
- Sascha Sadewasser, Thilo Glatzel
- ISBN
- 9783642271137
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2013-11-30
- Sidor
- 334