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Interfacial Compatibility in Microelectronics

193,40 €

This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.

Undertitel
Moving Away from the Trial and Error Approach
ISBN
9781447124696
Språk
engelska
Vikt
518 gram
Utgivningsdatum
13.1.2012
Sidor
218