Infrared Ellipsometry on Semiconductor Layer Structures
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.
- Undertitel
- Phonons, Plasmons, and Polaritons
- Författare
- Mathias Schubert
- Upplaga
- 2004 ed.
- ISBN
- 9783540232490
- Språk
- Engelska
- Vikt
- 446 gram
- Utgivningsdatum
- 2004-11-26
- Sidor
- 196