
In-situ Electron Microscopy
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
- Undertitel
- Applications in Physics, Chemistry and Materials Science
- Redaktör
- Gerhard Dehm, James M. Howe, Josef Zweck
- ISBN
- 9783527319732
- Språk
- Engelska
- Vikt
- 907 gram
- Utgivningsdatum
- 2012-04-26
- Förlag
- Wiley-VCH Verlag GmbH
- Sidor
- 402