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Helium Ion Microscopy
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Helium Ion Microscopy

inbunden, 2016
Engelska
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
Upplaga
1st ed. 2016
ISBN
9783319419886
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2016-10-12
Sidor
526