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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Författare:
inbunden, 2009
Engelska
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Författare
Patrick Echlin
Upplaga
2009 ed.
ISBN
9780387857305
Språk
Engelska
Vikt
446 gram
Utgivningsdatum
2009-03-19
Sidor
332